$xray diffraction gratings thesis$

$xray diffraction gratings thesis$

The configuration of the instrument of this type is suited to soft X-ray reflectometry and metrology with the use of laser-plasma and synchrotron radiation sources, and is perfectly compatible with modern CCD detectors. A spectral resolving power λ/δλ = 1300 is demonstrated at a wavelength of 182 Å. Laser-produced plasma spectra excited by a focused laser beam (0.5 J, 8 ns, 1.06 μm) are recorded. The short-wavelength boundary of the operating range is determined by the spectral source brightness and the more » reflection coefficients of the grating and the mirror rather than by defocusing. The entrance and output slits of the instrument are immobile, and the focal distance varies only slightly over its operating spectral range. The optical arrangement of the spectrograph comprises a focusing spherical (R = 6000 mm) mirror, mounted at a grazing angle of 8.34 °, and a grazing-incidence plane varied line-space (VLS) grating operating for a constant deflection angle of 16.68 °. more » (paper) = ,Ī flat-field scanning spectrometer/monochromator of the Hettrick – Underwood type is implemented for a wavelength range λ ≈ 50 – 330 Å. We describe flat-field grazing-incidence spectrometers with concave VLS gratings, which are compatible with modern CCD detectors, as well as plane VLS gratings, which are the key elements of scanning high- and ultrahigh-resolution spectrometers/monochromators with a constant deviation angle and stigmatic (imaging) spectrometers, which are also compatible with CCD detectors. Also discussed are achievements in the recently undertaken design and development of special-purpose VLS spectrometers intended for the investigation of the electronic structure of different materials and molecules by the spectroscopic technique of resonant inelastic X-ray scattering of synchrotron radiation. The review considers the employment of VLS-grating instruments intended for the spectroscopy of laboratory and astrophysical plasmas, including the diagnostics of relativistic laser plasmas, for measuring X-ray laser linewidths, for recording the high-order harmonics of laser radiation, the radiation of fast electric discharges and other laboratory X-ray sources, as well as in reflectometry, X-ray fluorescence analysis and microscopy with the use of synchrotron radiation and laser-plasma radiation, and in emission spectroscopy combined with an electron microscope. We briefly review the works concerned with the development and experimental use of the spectral instruments based on aperiodic reflection gratings whose spacing varies monotonically across the aperture according to a prescribed law (VLS gratings).

$xray diffraction gratings thesis$

Xray diffraction gratings thesis